Multipurpose synchrotron spectrometer of the Kurchatov Institute: Part 2. X-ray fluorescent element analysis


The performance of the Kurchatov Institute’s multiporpose synchrotron spectrometer is diversified by adding the equipment for the X-ray fluorescent element analysis. The X-ray optical focusing system of the spectrometer is described. The analysis results for the copper, lead, and gold-nanofilm samples are reported.

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Correspondence to V. N. Shalyapin.

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Original Russian Text © S.I. Tyutyunnikov, V.N. Shalyapin, A.D. Belyaev, A.N. Artemiev, N.A. Artemiev, B.F. Kirillov, M.V. Kovalchiuk, A.A. Demkiv, G.A. Knyazev, 2017, published in Pis’ma v Zhurnal Fizika Elementarnykh Chastits i Atomnogo Yadra, 2017.

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Tyutyunnikov, S.I., Shalyapin, V.N., Belyaev, A.D. et al. Multipurpose synchrotron spectrometer of the Kurchatov Institute: Part 2. X-ray fluorescent element analysis. Phys. Part. Nuclei Lett. 14, 474–479 (2017).

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  • synchrotron radiation
  • X-ray fluorescent element analysis