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Robust method for dielectric tensor evaluation from spectrophotometric data

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Abstract

This paper deals with the mathematical modeling of the interaction between the electromagnetic waves of the optical range and multilayer optical structures, the application of which is highly popular today. A robust method for calculating the optical properties of a single layer is described using the measured or required parameters. References to the scientific works reported in this area are presented.

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Authors and Affiliations

  1. Peoples’ Friendship University of Russia, Moscow, Russia

    A. A. Khokhlov

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  1. A. A. Khokhlov
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Khokhlov, A.A. Robust method for dielectric tensor evaluation from spectrophotometric data. Phys. Part. Nuclei Lett. 8, 494–497 (2011). https://doi.org/10.1134/S1547477111050116

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  • DOI: https://doi.org/10.1134/S1547477111050116

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