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MIS-1 electron-beam ion source

  • Problems of Charged Particle Accelerators: Electron-Positron Colliders VIII International Scientific Workshop to the Memory of Professor V.P. Sarantsev Alushta, Crimea, Ukraine, 31 August–5 September 2009
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Abstract

The Institute of Nuclear Physics (INP) has developed and produced electron-beam multiply charged ion sources. These ion sources give the electron beam its high density in the ionization area, at the ion trap ≥103 A/cm2. They produce multiply charged ions of various elements, both gaseous and solid ones. These ion sources successfully employ the technique of the dozed inlet of solid-element atoms into the ion trap.

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References

  1. E. D. Donetz, V. I. Ilyushenko, and V. A. Alpert, in Proc. of the Intern. Conf. on Ion Sources (Saclay, 1969), p. 635.

  2. V. G. Abdulmanov, O. Yu. Maslennikov, P. V. Nevskii, V. P. Rybachek, and V. K. Fedyaev, “Electron-Optic System of the Multicharge Ion Source (MIS-1),” in Proc. of the 8th Int. Symp. on Electron Beam Ion Sources and Their Applications (Am. Inst. Phys., 2001), pp. 170–177.

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Authors and Affiliations

  1. Budker Institute of Nuclear Physics, Novosibirsk State University, Novosibirsk, Russia

    V. G. Abdulmanov & N. S. Dikansky

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  1. V. G. Abdulmanov
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  2. N. S. Dikansky
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Abdulmanov, V.G., Dikansky, N.S. MIS-1 electron-beam ion source. Phys. Part. Nuclei Lett. 7, 539–542 (2010). https://doi.org/10.1134/S1547477110070241

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  • DOI: https://doi.org/10.1134/S1547477110070241

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