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Valence State of Copper in CuI–AgI–As2Se3 Chalcogenide Films and Membrane Surface Composition of Ion-Selective Electrodes According to the Data of X-Ray Photoelectron and Auger-Electron Spectroscopy

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Abstract

The valence state of copper and the composition of the surface of the membranes of film electrodes with the composition CuI–AgI–As2Se3 are studied. Using X-ray photoelectron spectroscopy, it is shown that in CuI–AgI–As2Se3 chalcogenide films the copper atom is in the Cu(I) state. Auger-electron spectroscopy is used to prove the applicability of the modified surface layer model to explain the ion sensitivity of chalcogenide film sensors.

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Authors and Affiliations

  1. Department of Chemistry, St. Petersburg State Forestry University, 194021, St. Petersburg, Russia

    D. L. Baidakov, Yu. T. Vigranenko, O. P. Kovaleva & A. P. Lyubavina

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  1. D. L. Baidakov
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  2. Yu. T. Vigranenko
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  3. O. P. Kovaleva
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  4. A. P. Lyubavina
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Baidakov, D.L., Vigranenko, Y.T., Kovaleva, O.P. et al. Valence State of Copper in CuI–AgI–As2Se3 Chalcogenide Films and Membrane Surface Composition of Ion-Selective Electrodes According to the Data of X-Ray Photoelectron and Auger-Electron Spectroscopy. Glass Phys Chem 48, 280–284 (2022). https://doi.org/10.1134/S1087659622040034

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