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Structural peculiarities of amorphous semiconductors As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 doped with samarium

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Abstract

The structure of chalcogenide vitreous semiconductors (CVSs) As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 and the influence on them of samarium additives is studied using the technique of X-ray diffraction. The observed peculiarities of the diffraction picture are explained by the Elliott void-cluster model. The structural parameters of CVS materials As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 with and without admixtures of samarium are determined.

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Authors and Affiliations

  1. Abdulayev Institute of Physics, Academy of Sciences of Azerbaijan, pr. G. Djavida 33, Baku, AZ 1143, Azerbaijan

    R. I. Alekberov, G. A. Isayeva, S. I. Mekhtiyeva & A. I. Isayev

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  1. R. I. Alekberov
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  2. G. A. Isayeva
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  3. S. I. Mekhtiyeva
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  4. A. I. Isayev
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Correspondence to R. I. Alekberov.

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Original Russian Text © R.I. Alekberov, G.A. Isayeva, S.I. Mekhtiyeva, A.I. Isayev, 2014, published in Fizika i Khimiya Stekla.

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Alekberov, R.I., Isayeva, G.A., Mekhtiyeva, S.I. et al. Structural peculiarities of amorphous semiconductors As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 doped with samarium. Glass Phys Chem 40, 549–552 (2014). https://doi.org/10.1134/S1087659614050022

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  • DOI: https://doi.org/10.1134/S1087659614050022

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