Abstract
Thermally stable nanocrystalline films of lead sulfide PbS were prepared using the chemical deposition method. The thickness of the films measured by interferometry was approximately equal to 100 nm, and the average particle size determined from the broadening of the X-ray diffraction reflections was approximately 80 nm. X-ray diffraction analysis revealed that annealing of the film at a temperature of 350°C in air results in the formation of a protective oxide sulfate phase of the composition PbO · PbSO4 on the surface of the film. It was established that the oxide sulfate phase prevents a further oxidation of the film and serves as an inhibitor of the growth of PbS nanoparticles upon heating up to a temperature of 500°C. The factors responsible for the high thermal stability of the sizes of nanoparticles and the optical properties of the PbS nanocrystalline film were discussed.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Bauer, G. and Clemens, H., Physics and Applications of IV–VI Compound Quantum Well and Superlattice Structures, Semicond. Sci. Technol., 1990, vol. 5, no. 3S, pp. 122–130.
Preier, H., Physics and Applications of IV–VI Compound Semiconductor Lasers, Semicond. Sci. Technol., 1990, vol. 5, no. 3S, pp. 12–20.
Rempel, A.A., Nanotechnologies: Properties and Applications of Nanostructured Materials, Usp. Khim., 2007, vol. 76, no. 5, pp. 474–500.
Olkhovets, A., Hsu, R.-C., Lipovskii, A., and Wise, F.W., Size-Dependent Temperature Variation of the Energy Gap in Lead-Salt Quantum Dots, Phys. Rev. Lett., 1998, vol. 81, no. 16, pp. 3539–3542.
Thielsch, R., Böhme, T., Reiche, R., Schläfer, D., Bauer, H.-D., and Botteher, H., Quantum-Size Effects of PbS Nanocrystallites in Evaporated Composite Films, Nanostruct. Mater., 1998, vol. 10, no. 2, pp. 131–149.
Chen, J.-H., Chao, C.-G., Ou, J.-C., and Liu, T.-F., Growth and Characteristics of Lead Sulfide Nanocrystals Produced by the Porous Alumina Membrane, Surf. Sci., 2007, vol. 601, pp. 5142–5147.
Qadri, S.B., Singh, A., and Yousuf, M., Structural Stability of PbS Films as a Function of Temperature, Thin Solid Films, 2003, vols. 431–432, pp. 506–510.
Pop, I., Ionescu, V., Nascu, C., Vomir, V., Grecu, R., and Indrea, E., The Study of Lead Sulfide Films: The Behaviour at Low Temperature Thermal Treatment, Thin Solid Films, 1996, vol. 283, pp. 119–123.
Parra, R.S., George, P.J., Sanchez, G.G., Jimenez Gonzalez A.E., Banos, L., and Nair, P.K., Optical and Electrical Properties of PbS+In Thin Films Subjected to Thermal Processing, J. Phys. Chem. Solids, 2000, vol. 61, pp. 659–668.
Kozhevnikova, N.S. and Rempel, A.A., Fizicheskaya khimiya vodnykh rastvorov (Physical Chemistry of Aqueous Solutions), Yekaterinburg: Ural State Technical University-Ural Polytechnical Institute, 2006 [in Russian].
Kozhevnikova, N.S., Kurlov, A.S., Uritzkaya, A.A., and Rempel, A.A., Diffraction Analysis of Nanocrystalline Particle Size of Lead and Cadmium Sulfides Prepared by Chemical Deposition from Aqueous Solutions, Zh. Strukt. Khim., 2004, vol. 45 (Prilozh. 1), pp. 156–162 [J. Struct. Chem. (Engl. transl.), 2004, vol. 45 (Suppl. 1), pp. S154–S159].
Gusev, A.I. and Rempel’, S.V., X-Ray Diffraction Study of the Nanostructure Resulting from Decomposition of (ZrC)1 − x (NbC)x Solid Solutions, Neorg. Mater., 2003, vol. 39, no. 1, pp. 49–53 [Inorg. Mater. (Engl. transl.), 2003, vol. 39, no. 1, pp. 43–46].
Kurlov, A.S. and Gusev, A.I., Determination of the Particle Sizes, Microstrains, and Degree of Inhomogeneity in Nanostructured Materials from X-Ray Diffraction Data, Fiz. Khim. Stekla, 2007, vol. 33, no. 3, pp. 383–392 [Glass Phys. Chem. (Engl. transl.), 2007, vol. 33, no. 3, pp. 276–283].
Valeeva, A.A., Gizhevskii, B.A., Pilyugin, V.P., and Rempel’, A.A., Effect of Severe Plastic Deformation on the Structure of Polycrystalline Titanium Monoxide, Fiz. Met. Metalloved., 2005, vol. 99, no. 1, pp. 62–68 [Phys. Met. Metallogr. (Engl. transl.), 2005, vol. 99, no. 1, pp. 56–61].
Pasquini, L., Rempel, A.A., Würschum, R., Reimann, K., Müller, M.A., Fultz, B., and Schaefer, H.-E., Thermal Vacancy Formation and DO3 Ordering in Nanocrystalline Intermetallic (Fe3Si)95Nb5, Phys. Rev. B: Condens. Matter, 2001, vol. 63, no. 13, article 134114 (7 pages).
Hall, W.H., X-Ray Line Broadening in Metals, Proc. Phys. Soc., London, Sect. A, 1949, vol. 62, part 11, no. 359, pp. 741–743.
Hall, W.H. and Williamson, G.K., The Diffraction Pattern of Cold Worked Metals: I. The Nature of Extinction, Proc. Phys. Soc, London, Sect. B, 1951, vol. 64, part 11, no. 383, pp. 937–946.
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © S.I. Sadovnikov, N.S. Kozhevnikova, A.A. Rempel, 2009, published in Fizika i Khimiya Stekla.
Rights and permissions
About this article
Cite this article
Sadovnikov, S.I., Kozhevnikova, N.S. & Rempel, A.A. Thermal stability of lead sulfide nanocrystalline films. Glass Phys Chem 35, 60–66 (2009). https://doi.org/10.1134/S108765960901009X
Published:
Issue Date:
DOI: https://doi.org/10.1134/S108765960901009X