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Effect of internal chip stripes on susceptibility to supershort ultrawideband electromagnetic pulses

  • Physical Processes in Electron Devices
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Abstract

Reversible functional failure of an ATmega 8515 microcontroller (MC) is used to demonstrate the importance of internal stripes of chips in radio-transparent package in the analysis of susceptibility of microelectronic components to radio-frequency radiation. Experiments under different conditions for MC irradiation are performed and induced electric voltages are calculated using the simplest model of antenna reception. The calculated results are in qualitative agreement with the experimental data.

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Authors and Affiliations

  1. Zababakhin All-Russia Research Institute of Technical Physics, Russian Federal Nuclear Center, Snezhinsk, Chelyabinsk oblast, 456770, Russia

    A. P. Stepovik, E. Yu. Shamaev & M. M. Armanov

Authors
  1. A. P. Stepovik
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  2. E. Yu. Shamaev
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  3. M. M. Armanov
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Corresponding author

Correspondence to A. P. Stepovik.

Additional information

Original Russian Text © A.P. Stepovik, E.Yu. Shamaev, M.M. Armanov, 2017, published in Radiotekhnika i Elektronika, 2017, Vol. 62, No. 8, pp. 812–818.

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Stepovik, A.P., Shamaev, E.Y. & Armanov, M.M. Effect of internal chip stripes on susceptibility to supershort ultrawideband electromagnetic pulses. J. Commun. Technol. Electron. 62, 910–915 (2017). https://doi.org/10.1134/S1064226917080137

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  • DOI: https://doi.org/10.1134/S1064226917080137

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