Abstract
Modern trends in the technology of Cd x Hg1–x Te-based photosensitive barrier structures for the middle and far infrared bands, which can operate at near-room temperatures, are analyzed. Main approaches to solving the problem of increasing the photodiode-detector operating temperature have been considered and analyzed.
Similar content being viewed by others
References
T. Ashley and C. T. Elliot, Electron. Lett. 21, 451 (1985).
S. Maimon and G. W. Wiks, Appl. Phys. Lett. 89, 151109 (2006).
M. Kopytko, A. Keblowski, W. Gawron, and P. Madejczyk, Opto-Electron. Rev. 23 (2), 143 (2015).
Z. H. Ye, Y. Y. Chen, P. Zhang, et al., Proc. SPIE 9070, 90701L-1 (2014).
P. Martyniuk and A. Rogalski, Bull. Polish. Acad. Sci. Techn. Sci. 61 (1), 211 (2013).
N. D. Akhavan, G. Jolley, G. A. Umana-Membreno, et al., J. Electron. Mater. 44, 3044 (2015).
M. Kopytko, Infrared Phys. & Technol. 64, 47 (2014).
M. Kopytko, J. Wróbel, K. Józwikowski, et al., J. Electron. Mater. 44, 158 (2015).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © A.V. Voitsekhovskii, D.I. Gorn, 20116, published in Prikladnaya Fizika, 2016, No. 4, pp. 83–86.
Rights and permissions
About this article
Cite this article
Voitsekhovskii, A.V., Gorn, D.I. Analysis of the nBn-type barrier structures for infrared photodiode detectors. J. Commun. Technol. Electron. 62, 314–316 (2017). https://doi.org/10.1134/S1064226917030214
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1064226917030214