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On eikonal aberrations in axisymmetric double-reflector telescopic systems

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Abstract

A formula describing the eikonal distribution on the surface of the main reflector of a doublereflector system of a general form is derived and its expansion in powers of the offset of the source from the focus up to the fourth-order terms is obtained. The analysis and minimization of aberrations for a doublereflector aplanatic Schwarzschild system are performed.

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References

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Authors and Affiliations

  1. Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, ul. Mokhovaya 11 korp. 7, Moscow, 125009, Russia

    A. S. Venetskiy & V. A. Kaloshin

Authors
  1. A. S. Venetskiy
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  2. V. A. Kaloshin
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Corresponding author

Correspondence to A. S. Venetskiy.

Additional information

Original Russian Text © A.S. Venetskiy, V.A. Kaloshin, 2016, published in Radiotekhnika i Elektronika, 2016, Vol. 61, No. 4, pp. 327–336.

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Venetskiy, A.S., Kaloshin, V.A. On eikonal aberrations in axisymmetric double-reflector telescopic systems. J. Commun. Technol. Electron. 61, 385–394 (2016). https://doi.org/10.1134/S1064226916040136

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  • DOI: https://doi.org/10.1134/S1064226916040136

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