Abstract
It is demonstrated that a 1D photonic crystal with periodicity defects can be used as a tunable cavity that makes it possible to control resonance features in the reflection spectrum of the probe of a microwave near-field microscope based on a cylindrical cavity with a loop coupling element. The probe is sensitive to variations in the parameters of dielectric plates under study with different permittivities and thicknesses of nanometer metal layers deposited on the dielectric plates in the measurements at fixed distances from the probe tip and in contact regime.
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E. M. Gershenzon, L. B. Litvak-Gorskaya, L. A. Plokhova, and T. S. Zarubina, Poluprovodn. Prib. Primen., No. 23, 3 (1970).
D. A. Usanov, Microwave Methods for the Measurement of Semiconductor Parameters (Saratov. Gos. Univ., Saratov, 1985) [in Russian].
Yu. G. Arapov and A. B. Davydov, Defektoskopiya, No. 11, 63 (1978).
M. N. Afsar, J. R. Birch, and R. N. Clarke, Proc. IEEE 74, 183 (1986).
E. Yablonovitch, T. J. Gimitter, and R. D. Meade, Phys. Rev. Lett. 67, 3380 (1991).
Crystal Gerard W. Burns, I. G. Thayne, and J. M. Arnold, in Proc. Eur. Conf. on Wireless Technology, (ECWT 2004), Amsterdam, Netherlands, Oct. 11–12, 2004 (IEEE, New York, 2005), p. 229.
Pattern Hsien-Shun Wu and Ching-Kuang C. Tzuang, in Proc. 34th Eur. Microwave Conf., Amsterdam, Netherlands, Oct. 12–14, 2004 (Horizon House, London, 2004), Vol. 2, p. 1189.
C. A. Kuriazidou, H. F. Contopanagos, and N. G. Alexopolos, IEEE Trans. Microwave Theory Tech. 49, 297 (2001).
D. M. Klymyshyn, H. C. Jayatilaka, M. Börner, and J. Mohr, IEEE Trans. Microwave Theory Tech. 57, 2753 (2009).
D. A. Usanov, A. V. Skripal’, A. V. Abramov, et al., Izv. Vyssh. Uchebn. Zaved. Elektronika, No. 6, 25 (2007).
Yu. V. Gulyaev, S. A. Nikitov, D. A. Usanov, A. V. Skripal’, A. E. Postel’ga, and D. V. Ponomarev, Dokl. Phys. 57, 145 (2012).
S. M. Anlage, D. E. Steinhauer, B. J. Feenstra, et al., in Microwave Superconductivity, Ed. by H. Weinstock and M. Nisenoff (Kluwer, Amsterdam., 2001), p. 239.
D. A. Usanov, Near-Field Scanning Microwave Microscopy and Its Applications (Saratov. Gos. Univ., Saratov, 2010) [in Russian].
D. A. Usanov and S. S. Gorbatov, Near-Field Effects in Electrodynamic Systems with Inhomogeneities and Their Application in Microwave Technology (Saratov. Gos. Univ., Saratov, 2011) [in Russian].
D. A. Usanov and S. S. Gorbatov, Izv. Vyssh. Uchebn. Zaved., Radiofiz. 44, 1046 (2001).
D. A. Usanov and S. S. Gorbatov, Izv. Vyssh. Uchebn. Zaved., Radioelektronika 45, 26 (2002).
R. A. Kleismit, M. K. Kazimierczuk, and G. Kozlowski, IEEE Trans. Microwave Theory Tech. 54, 639 (2006).
D. A. Usanov, A. Yu. Vagarin, and A. A. Bezmenov, Invention Certificate, No. 1114979, Byull. Izobret., No. 35 (1984).
D. A. Usanov, S. S. Gorbatov, S. B. Venig, and V. E. Orlov, Tech. Phys. Lett. 26, 827 (2000).
D. A. Usanov and S. S. Gorbatov, Izv. Vyssh. Uchebn. Zaved., Radioelektronika 49(2), 27 (2006).
D. A. Usanov and S. S. Gorbatov, Prib. Tekh. Eksp., No. 1, 72 (2003).
D. A. Usanov, S. S. Gorbatov, A. N. Sorokin, and V. Yu. Kvasko, RF Patent No. 2373545, Byull. Izobret., No. 32 (2009).
D. A. Usanov, S. S. Gorbatov, and V. Yu. Kvasko, Izv. Vuzov. Radioelektronika, No. 6, 66 (2010).
D. A. Usanov, V. E. Orlov, and A. A. Bezmenov, Elektron. Tekhnika. Elektron. SVCh, No. 3, 37 (1977).
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Original Russian Text © D.A. Usanov, S.A. Nikitov, A.V. Skripal’, A.P. Frolov, 2013, published in Radiotekhnika i Elektronika, 2013, Vol. 58, No. 12, pp. 1179–1186.
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Usanov, D.A., Nikitov, S.A., Skripal’, A.V. et al. Microwave near-field microscope based on a photonic crystal with a cavity and a controlled coupling element as a probe. J. Commun. Technol. Electron. 58, 1130–1136 (2013). https://doi.org/10.1134/S1064226913120176
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DOI: https://doi.org/10.1134/S1064226913120176