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Modification of Gaussian beams reflected by a thin amplifying film

  • Electrodynamics and Wave Propagation
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Abstract

Reflection of a Gaussian beam by a thin inverse-medium film is considered. The profile of the beam’s field transformed upon reflection is analyzed with the use of the representation of the field as a Fourier integral over plane-wave components. It is shown that the complex deformation of the field profile is due to two main factors: the Goos-Hanchen longitudinal shift on the upper medium interface and the shift that is due to the presence of the film/substrate interface and is oriented along the direction of the beam incidence.

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Authors
  1. Yu. F. Nasedkina
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  2. D. I. Sementsov
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  3. O. V. Mosin
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Additional information

Original Russian Text © Yu.F. Nasedkina, D.I. Sementsov, O.V. Mosin, 2008, published in Radiotekhnika i Elektronika, 2008, Vol. 53, No. 12, pp. 1477–1485.

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Nasedkina, Y.F., Sementsov, D.I. & Mosin, O.V. Modification of Gaussian beams reflected by a thin amplifying film. J. Commun. Technol. Electron. 53, 1391–1398 (2008). https://doi.org/10.1134/S1064226908120036

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  • DOI: https://doi.org/10.1134/S1064226908120036

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