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An Influence of Mechanical Stresses on the Magnitude of the Internal Field in Lead Zirconate Titanate Thin Films

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Abstract

In self-polarized lead zirconate titanate thin films formed on platinized silicon substrates, a significant increase in the internal electric field was observed as a result of long-term aging. To explain this phenomenon, a mechanism is proposed for the formation of the internal field associated with the diffusion of charged oxygen vacancies, which, in turn, is due to the action of a mechanical stress gradient. The diffusion coefficient of charged oxygen vacancies was estimated to be ~ 3 × 10–16 cm2/s.

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Authors and Affiliations

  1. Ioffe Institute, St. Petersburg, Russia

    A. R. Valeeva, E. Yu. Kaptelov, S. V. Senkevich & I. P. Pronin

  2. Peter the Great Saint-Petersburg Polytechnic University, St. Petersburg, Russia

    S. A Nemov

  3. Herzen State Pedagogical University of Russia, St. Petersburg, Russia

    V. P. Pronin

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  1. A. R. Valeeva
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  2. E. Yu. Kaptelov
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  3. S. V. Senkevich
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  4. I. P. Pronin
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  5. S. A Nemov
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  6. V. P. Pronin
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Correspondence to A. R. Valeeva.

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Valeeva, A.R., Kaptelov, E.Y., Senkevich, S.V. et al. An Influence of Mechanical Stresses on the Magnitude of the Internal Field in Lead Zirconate Titanate Thin Films. Tech. Phys. Lett. 49 (Suppl 3), S295–S298 (2023). https://doi.org/10.1134/S1063785023010327

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  • DOI: https://doi.org/10.1134/S1063785023010327

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