Abstract
The resistance to deformation and crack formation in epitaxial layers of metastable α- and ε(κ)‑Ga2O3 polymorphs grown on sapphire substrates has been studied by nanoindentation techniques. The epilayers of α-Ga2O3 (0001) and ε(κ)-Ga2O3 (001) polymorphs are characterized by hardness H (18.7 and 17.5 GPa) and Young’s modulus E (283.4 and 256.1 GPa), respectively. It is established that the critical stress intensity factor (characterizing the cracking resistance) for ε(κ)-Ga2O3 is K1c ∼ 0.67 MPa m1/2 and that for α-Ga2O3 is K1c ∼ 0.70 MPa m1/2.
Similar content being viewed by others
REFERENCES
S. Pearton, F. Ren, and M. Mastro, Gallium Oxide. Technology, Devices and Applications (Elsevier, Amsterdam, 2019). https://doi.org/10.1016/C2017-0-01768-8
S. Poncé and F. Giustino, Phys. Rev. Res. 2, 033102 (2020). https://doi.org/10.1103/PhysRevResearch.2.033102
Y. Q. Wu, S. Gao, and H. Huang, Mater. Sci. Semicond. Proc. 71, 321 (2017). https://doi.org/10.1016/j.mssp.2017.08.019
Y. Q. Wu, S. Gao, R. K. Kang, and H. Huang, J. Mater. Sci. 54, 1958 (2019). https://doi.org/10.1007/s10853-018-2978-9
S. Okada, K. Kudou, and I. Higashi, Nippon Kagaku Kaishi 1991, 1426 (1991). https://doi.org/10.1246/nikkashi.1991.1426
L. I. Guzilova, A. S. Grashchenko, A. I. Pechnikov, V. N. Maslov, D. V. Zav’yalov, V. L. Abdrachmanov, A. E. Romanov, and V. I. Nikolaev, Mater. Phys. Mech. 29, 166 (2016).
V. I. Nikolaev, A. V. Chikiryaka, L. I. Guzilova, and A. I. Pechnikov, Tech. Phys. Lett. 45, 1114 (2019). https://doi.org/10.1134/S1063785019110117
E. G. Víllora, S. Arjoca, K. Shimamura, D. Inomata, and K. Aoki, Proc. SPIE 8987, 89871U (2017). https://doi.org/10.1117/12.2039305
W. Mu, Z. Jia, Y. Yin, Q. Hu, Y. Li, B. Wu, J. Zhang, and X. Tao, J. Alloys Compd. 714, 453 (2017). https://doi.org/10.1016/j.jallcom.2017.04.185
A. S. Grashchenko, S. A. Kukushkin, V. I. Nikolaev, A. V. Osipov, E. V. Osipova, and I. P. Soshnikov, Phys. Solid State 60, 852 (2018). https://doi.org/10.1134/S1063783418050104
J. Zhang, H. Zhou, Y. Xu, Y. Li, and J. Shen, J. Synth. Cryst. 49, 1064 (2020).
H. He, R. Orlando, M. A. Blanco, R. Pandey, E. Amzallag, I. Baraille, and M. Rérat, Phys. Rev. B 74, 195123 (2006). https://doi.org/10.1103/PhysRevB.74.195123
F. Mezzadri, G. Calestani, F. Boschi, D. Delmonte, M. Bosi, and R. Fornari, Inorg. Chem. 55, 12079 (2016). https://doi.org/10.1021/acs.inorgchem.6b02244
A. I. Pechnikov, S. I. Stepanov, A. V. Chikiryaka, M. P. Shcheglov, M. A. Odnoblyudov, and V. I. Nikolaev, Semiconductors 53, 780 (2019). https://doi.org/10.1134/S1063782619060150
S. Shapenkov, O. Vyvenko, E. Ubyivovk, O. Medvedev, G. Varygin, A. Chikiryaka, A. Pechnikov, M. Scheglov, S. Stepanov, and V. Nikolaev, Phys. Status Solidi A 217, 1900892 (2020). https://doi.org/10.1002/pssa.201900892
A. C. Fischer-Cripps, Nanoindentation (Springer, Heidelberg, 2011).
V. I. Nikolaev, A. I. Pechnikov, V. V. Nikolaev, M. P. Sheglov, A. V. Chikiryaka, and S. I. Stepanov, in Proceedings of the 2019 Compound Semiconductor Week CSW (IEEE, 2019), p. 1. https://doi.org/10.1109/ICIPRM.2019.8819271
M. T. Laugier, J. Mater. Sci. Lett. 6, 897 (1987). https://doi.org/10.1007/BF01729862
I. Yonenaga, Mater. Trans. 46, 1979 (2005). https://doi.org/10.2320/matertrans.46.1979
ACKNOWLEDGMENTS
This work was performed with the use of a NanoTest microhardness meter (Micro Materials Ltd.) at the Unique Facility Physics, Chemistry, and Mechanics of Crystals and Thin Films (Institute of Problems of Mechanical Engineering, St. Petersburg). The authors are also grateful to Perfect Crystals LLC (St. Petersburg) for kindly providing samples for this study.
Funding
L.I. Guzilova, P.N. Butenko, A.V. Chikiryaka, A.I. Pechnikov, and V.I. Nikolaev carried out their part of the work in the framework of the project “Fundamental Problems of Physics and Chemistry of Nanostructured and Nanocomposite Materials and Device Structures: Physical Properties of Single Crystalline and Disordered Materials,” state order no. 0040-2014-0007. A.S. Grashchenko performed his part of the work in the framework of state orders to the Institute of Problems of Mechanical Engineering, project no. АААА-А18-118012790011-3.
Author information
Authors and Affiliations
Corresponding author
Ethics declarations
The authors declare that they have no conflicts of interest.
Additional information
Translated by P. Pozdeev
Rights and permissions
About this article
Cite this article
Guzilova, L.I., Grashchenko, A.S., Butenko, P.N. et al. Mechanical Properties of Epilayers of Metastable α- and ε-Ga2O3 Phases Studied by Nanoindentation. Tech. Phys. Lett. 47, 709–713 (2021). https://doi.org/10.1134/S106378502107021X
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S106378502107021X