Abstract
The effect of scattered beam electrons on the noise parameters of cyclotron protective devices in the microwave frequency band is experimentally investigated. It is shown that the beam electrons scattered by the residual gas particles are a source of additional noise of the device. The object of research was commercially available samples of cyclotron protective devices.
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ACKNOWLEDGMENTS
I am grateful to Yu.A. Budzinskii for helpful discussions.
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Translated by E. Chernokozhin
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Bykovskii, S.V. The Effect of Scattered Electrons on the Noise Figure of Cyclotron Protective Devices. Tech. Phys. Lett. 47, 593–596 (2021). https://doi.org/10.1134/S1063785021060195
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DOI: https://doi.org/10.1134/S1063785021060195