Abstract
Nonlinear optical microscopy techniques have been used to study thin films of single-phase (perovskite) and two-phase (perovskite–pyrochlore) lead zirconate titanate (PZT) deposited on Pt/TiO2/SiO2/Si by means of radio-frequency magnetron sputtering at various target–substrate distances (D = 30–70 mm). Results revealed inhomogeneous distribution of second-harmonic generation in spherulitic perovskite islands, including increased signal intensity at perovskite/pyrochlore interface, which may be related to a nonuniform distribution of mechanical stresses. Factors responsible for the observed strong variation in second-harmonic signal are discussed, including the mutual relationship between changes in the character of spherulitic structure and conditions of PZT film deposition depending on the target–substrate distance.
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This work was supported in part in the framework of a state order (project no. FSFZ-2020-0022) for E.D. Mishina and by the Program of Grants for Young MIREA–RTU Scientists (project no. NICh-43) for A.S. Elshin.
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Elshin, A.S., Pronin, I.P., Senkevich, S.V. et al. Nonlinear Optical Diagnostics of Thin Polycrystalline Lead Zirconate Titanate Films. Tech. Phys. Lett. 46, 385–388 (2020). https://doi.org/10.1134/S1063785020040215
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DOI: https://doi.org/10.1134/S1063785020040215