Abstract
Reflectance spectroscopy has been used to determine the refractive indices of nanoscale InxAlyGa1–x–yAs and InxAl1–xAs layers with indium and aluminum concentrations x = 0.21–0.24 and y = 0, 0.1, and 0.2 on specially created Bragg-reflector heterostructures at wavelengths in the range 700–2000 nm. It was demonstrated that the method based on an analysis of the auto- and cross-correlation coefficients of the wavelength derivatives of the dependence of the reflectance of structures of this kind in order to determine the dispersion curves of the materials forming a reflector. It was found that raising the concentration of indium in InGaAs and AlInAs leads to a substantial rise in the refractive index, with a preserved spectral run of the refractive indices, which is characteristic of gallium arsenide and aluminum arsenide.
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Original Russian Text © V.M. Emel’yanov, N.A. Kalyuzhnyy, S.A. Mintairov, M.Z. Shvarts, 2018, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2018, Vol. 44, No. 19, pp. 50–58.
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Emel’yanov, V.M., Kalyuzhnyy, N.A., Mintairov, S.A. et al. Optical Properties of InGaAs/InAlAs Metamorphic Nanoheterostructures for Photovoltaic Converters of Laser and Solar Radiation. Tech. Phys. Lett. 44, 877–880 (2018). https://doi.org/10.1134/S1063785018100061
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DOI: https://doi.org/10.1134/S1063785018100061