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Technical Physics Letters

, Volume 39, Issue 9, pp 822–824 | Cite as

Studying submicron voids in pyroboroncarbon with the focused ion beam technique

  • R. L. VolkovEmail author
  • N. I. Borgardt
  • V. N. Kukin
  • A. V. Agafonov
  • V. O. Kuznetsov
Article

Abstract

The focused ion beam technique is used for serial sectioning and visualizing 3D voids in pyroboroncarbon, measuring their volumes, and evaluating the local porosity of the material. Based on the results obtained, the error in determining the local porosity of pyroboroncarbon from the data of one section is found. With the use of serial cross sections, it is found that the porosity in the technological pyroboroncarbon crude product decreases in the course of its growth in vertical coaxial reactors.

Keywords

Technical Physic Letter Graphite Substrate Local Porosity Olympus Soft Image Solution Dimensional Picture 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Pleiades Publishing, Ltd. 2013

Authors and Affiliations

  • R. L. Volkov
    • 1
    • 2
    Email author
  • N. I. Borgardt
    • 1
    • 2
  • V. N. Kukin
    • 1
    • 2
  • A. V. Agafonov
    • 1
    • 2
  • V. O. Kuznetsov
    • 1
    • 2
  1. 1.National Research University of Electronic TechnologyZelenograd, MoscowRussia
  2. 2.OSC TRI KarbonZelenograd, MoscowRussia

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