Abstract
Hexagonal indium nitride (InN) films on (111)- and (100)-oriented yttria-stabilized zirconia (YSZ) substrates and (0001)-oriented Al2O3 substrates have been grown for the first time at a rate of 1 μm/h by the method of metalorganic vapor-phase epitaxy with plasma-assisted nitrogen activation in an electron cyclotron resonance discharge generated by gyrotron radiation at low-temperature (350°C) growth. InN films grown without buffer layers possess a textured polycrystalline structure. Using an InN/GaN double buffer layer, single-crystalline InN films have been obtained on Al2O3(0001) substrates. Data on the morphology, structure, and photoluminescent properties of the obtained InN films are presented.
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Original Russian Text © Yu.N. Buzynin, M.E. Viktorov, A.V. Vodop’yanov, S.V. Golubev, M.N. Drozdov, Yu.N. Drozdov, A.Yu. Luk’yanov, D.A. Mansfeld, E.V. Skorokhodov, O.I. Khrykin, V.I. Shashkin, 2013, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2012, Vol. 38, No. 24, pp. 86–93.
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Buzynin, Y.N., Viktorov, M.E., Vodop’yanov, A.V. et al. Growing InN films by plasma-assisted metalorganic vapor-phase epitaxy on Al2O3 and YSZ substrates in plasma generated by gyrotron radiation under electron cyclotron resonance conditions. Tech. Phys. Lett. 39, 51–54 (2013). https://doi.org/10.1134/S1063785013010069
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DOI: https://doi.org/10.1134/S1063785013010069