Abstract
A light-emitting diode (LED) structure based on group III nitride has been grown for the first time on Si(111) substrate with SiC buffer nanolayer (50- to 200-nm-thick) obtained by solid-phase epitaxy. This LED structure is characterized by record low (<108 cm−2) density of lattice misfit dislocations at a total dislocation density of ∼8 × 108 cm−2. The photo- and electroluminescence spectra of obtained structures have been measured.
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Original Russian Text © S.A. Kukushkin, A.V. Osipov, S.G. Zhukov, E.E. Zavarin, W.V. Lundin, M.A. Sinitsyn, M.M. Rozhavskaya, A.F. Tsatsulnikov, S.I. Troshkov, N.A. Feoktistov, 2012, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2012, Vol. 38, No. 6, pp. 90–95.
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Kukushkin, S.A., Osipov, A.V., Zhukov, S.G. et al. Group-III-nitride-based light-emitting diode on silicon substrate with epitaxial nanolayer of silicon carbide. Tech. Phys. Lett. 38, 297–299 (2012). https://doi.org/10.1134/S1063785012030261
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DOI: https://doi.org/10.1134/S1063785012030261