Abstract
Multilayer structures consisting of Co/TiO2 bilayers with partial layer thicknesses varied within several nanometers and a total thickness of up to 100 nm were obtained using the ion-beam sputter deposition method and studied using a combination of analytical techniques. It is shown that, in [Co(2 nm)/TiO2(2 nm)]15, [Co(2 nm)/TiO2(4 nm)]15, and [Co(4 nm)/TiO2(4 nm)]12 structures, the mean-square surface roughness does not exceed 0.9 nm, all partial layers are continuous, all interfaces are plane-parallel and sharp, and the characteristics of each layer are close to those of the corresponding bulk material. The [Co(2 nm)/TiO2(4 nm)]15 structure is characterized by the maximum transparency (exceeding 7% in he visible spectral range. The properties of these multilayer films are promising for applications in magnetooptics and spintronics. The surfaces of [Co(4 nm)/TiO2(2 nm)]15 and [Co(6 nm)/TiO2(2 nm)]12 structures have mean-square roughnesses above 1 nm and exhibit percolations with a surface density of up to 5 × 107 cm−2. A decrease in the partial layer thickness below 2 nm leads to the mixing of layers, while an increase in the thickness of individual TiO2 layers above 6 nm leads to significant differences of the optical transmission spectrum from that of the anatase form of TiO2 and to a decrease in the transparency.
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Original Russian Text © A.I. Stognij, M.V. Pashkevich, N.N. Novitskii, A.V. Bespalov, 2010, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2010, Vol. 36, No. 9, pp. 73–81.
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Stognij, A.I., Pashkevich, M.V., Novitskii, N.N. et al. Ion-beam engineering of Co/TiO2 multilayer nanostructures. Tech. Phys. Lett. 36, 426–429 (2010). https://doi.org/10.1134/S1063785010050111
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DOI: https://doi.org/10.1134/S1063785010050111