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Ellipsometry of chemically deposited PbS-ZnS films

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Abstract

The optical and dielectric characteristics of hydrochemically deposited films of lead sulfide (PbS) and supersaturated substitutional solid solutions of the PbS-ZnS system have been studied by the ellipsometry techniques. It is established that the formation of solid solutions leads to an increase in the refractive index and a decrease in the imaginary part of the complex dielectric constant as compared to those of pure PbS films. An increase in the content of ZnS in the solid solution us accompanied by a significant decrease in the dielectric loss tangent.

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Correspondence to N. M. Barbin.

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Original Russian Text © V.V. Sal’nikov, V.F. Markov, N.M. Barbin, L.N. Maskaeva, M.P. Mironov, 2009, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2009, Vol. 35, No. 16, pp. 34–39.

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Sal’nikov, V.V., Markov, V.F., Barbin, N.M. et al. Ellipsometry of chemically deposited PbS-ZnS films. Tech. Phys. Lett. 35, 756–758 (2009). https://doi.org/10.1134/S1063785009080197

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  • DOI: https://doi.org/10.1134/S1063785009080197

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