Abstract
The mechanism of anode foil damage during the extraction of a high-power pulsed electron beam from a high-current diode has been experimentally studied on a TEU-500 electron accelerator [1]. It is established that the breakage of the anode foil is caused by the appearance of cathode spots on its surface, the intense electron emission from these spots during positive voltage pulses (postpulses following the main negative pulse of accelerating voltage), and the formation of arc discharge in the interelectrode gap. The improvement of diode matching to the pulse-forming line of the accelerator and the use of an auxiliary electrode (anode) forming additional vacuum discharge gap (crowbar) with the cathode practically excludes the anode foil breakage by arc discharge and significantly increases the working life of the foil (up to ∼105 electron beam pulses).
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G. E. Remnev, E. G. Furman, A. I. Pushkarev, et al., Prib. Tekh. Éksperim. 47(3), 130 (2004) [Instr. Experim. Tech. 47, 394 (2004)].
G. A. Mesyats, Pulsed Power Engineering and Electronics (Nauka, Moscow, 2004) [in Russian].
E. I. Abdullin, S. Ya. Belomyttsev, S. I. Bugaev, et al., Fiz. Plazmy (Moscow) 17, 741 (1991) [Sov. Phys. Plasma Phys. 17, 434 (1991)].
V. M. Bystritskii, G. E. Remnev, and Yu. I. Usov, Izv. Vyssh. Ucheb. Zaved., Fiz., No. 5, 135 (1978).
G. I. Dolgachev, M. S. Nitishinskiy, and A. G. Ushakov, Proc. 12th Int. Conf. on High Power Particle Beams (June 7–12, 1998, Haifa, Israel), Vol. 1, pp. 281–284.
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Original Russian Text © V.V. Ezhov, E.V. Krastelev, G.E. Remnev, 2009, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2009, Vol. 35, No. 15, pp. 91–96.
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Ezhov, V.V., Krastelev, E.V. & Remnev, G.E. Protecting the anode foil of a high-current electron accelerator against arc-discharge damage. Tech. Phys. Lett. 35, 730–732 (2009). https://doi.org/10.1134/S1063785009080124
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DOI: https://doi.org/10.1134/S1063785009080124