Abstract
Mechanisms of the structural modification of stacking fault tetrahedra (SFTs) upon the absorption of point defects have been studied by the method of molecular dynamics. The sequential absorption of vacancies by a perfect SFT is accompanied by the following transformations: (i) the formation of a step on one of the SFT faces, (ii) a change in the step sign upon reaching the middle of the face, (iii) the formation of an SFT with truncated vertex, and (iv) the formation of the perfect SFT. Upon the absorption of interstitial atoms, the stages of SFT transformation follow the reverse order.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
V. V. Kirsanov, A. L. Suvorov, and Yu. V. Trushin, Radiation-Induced Defect Formation in Metals (Énergoatomizdat, Moscow, 1985).
D. Rodney and G. Martin, Phys. Rev. B 61, 8714 (2000).
B. D. Wirth, V. V. Bulatov, and T. Diaz de la Rubia, J. Eng. Mater. Technol. 124, 329 (2002).
S. J. Zinkle and Y. Matsukawa, J. Nucl. Mater. 329–333, 88 (2004).
P. Szelestey, M. Patriarca, and K. Kaski, Modell. Simul. Mater. Sci. Eng., No. 13, 541 (2005).
J. P. Hirth and J. Lothe, Theory of Dislocations (McGraw-Hill, New York, 1967).
M. Kiritani, Y. Satoh, Y. Kizuka, K. Arakawa, Y. Ogasawara, S. Arai, and Y. Shimomura, Phil. Mag. Lett. 79, 797 (1999).
K. Arakawa, Sh. Arai, H. Orihara, K. Ono, and M. Kiritani, J. Electron. Microsc. 51, S225 (2002).
F. Cleri and V. Rosato, Phys. Rev. B 48, 22 (1993).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © G.M. Poletaev, M.D. Starostenkov, 2009, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2009, Vol. 35, No. 1, pp. 3–10.
Rights and permissions
About this article
Cite this article
Poletaev, G.M., Starostenkov, M.D. Structural transformations of stacking fault tetrahedra upon the absorption of point defects. Tech. Phys. Lett. 35, 1–4 (2009). https://doi.org/10.1134/S1063785009010015
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063785009010015