Abstract
The effect of irradiation with fast reactor neutrons at an effective energy of 1 MeV and a fluence within Φ = 1 × 1014−5 × 1015 n/cm2 on the photoelectric parameters of p-n-InSe homojunctions obtained in direct optical contact between p- and n-type semiconductors has been studied. The exposure to fast neutrons leads to an increase in the rectification coefficient and the diode ideality factor of the current-voltage characteristics with increasing neutron dose. No significant changes have been observed in the photosensitivity spectra of p-n-InSe structures irradiated to various doses, which allows these structures to be recommended for the creation of radiation-resistant photodetectors.
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Original Russian Text © Z.D. Kovalyuk, O.A. Politanska, P.G. Litovchenko, V.F. Lastovetskii, O.P. Litovchenko, V.K. Dubovoi, L.A. Polivtsev, 2007, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2007, Vol. 33, No. 18, pp. 14–22.
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Kovalyuk, Z.D., Politanska, O.A., Litovchenko, P.G. et al. Effect of neutron radiation on the photoelectric parameters of p-n-InSe structures. Tech. Phys. Lett. 33, 767–770 (2007). https://doi.org/10.1134/S1063785007090167
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DOI: https://doi.org/10.1134/S1063785007090167