Abstract
The diffusion of nickel atoms in samarium monosulfide (SmS) has been studied for the first time. Using the sequential layer removal technique, it was found that the coefficient of diffusion of the 63Ni radioactive isotope at a temperature of T = 1050°C amounts to D ∼ 1.8 × 10−10 cm2/s in SmS single crystals and to 5.3 × 10−9 and 1.2 × 10−10 cm2/s for the fast and slow diffusion components, respectively, in polycrystalline SmS. The process of nickel diffusion in thin polycrystalline SmS films was studied using an X-ray diffraction technique. The coefficient of diffusion at T = 400°C in thin-film samples according to these data is ∼10−13 cm2/s.
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References
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Original Russian Text © V.A. Didik, V.V. Kaminskiĭ, E.A. Skoryatina, V.P. Usacheva, N.V. Sharenkova, A.V. Golubkov, 2006, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2006, Vol. 32, No. 13, pp. 1–5.