Abstract
The temperature dependences of the thermostimulated capacitance and the voltage dependences of the transconductance were measured for heterostructures based on InGaN Solid solutions. Based on these data, the energies of deep centers, which can participate in the recombination flux formation in these structures, were determined.
Similar content being viewed by others
References
N. I. Kuznetsov and K. G. Irvine, Fiz. Tekh. Poluprovodn. (St. Petersburg) 32, 369 (1998) [Semiconductors 32, 335 (1998)].
V. Yu. Nekrasov, L. V. Belyakov, O. M. Sreseli, and N. N. Zinov’ev, Fiz. Tekh. Poluprovodn. (St. Petersburg) 33, 1428 (1999) [Semiconductors 33, 1284 (1999)].
A. N. Georgobiani, A. N. Gruzintsev, M. O. Vorob’ev, et al., Fiz. Tekh. Poluprovodn. (St. Petersburg) 35, 725 (2001) [Semiconductors 35, 695 (2001)].
S. S. Mamakin, A. E. Yunovich, A. B. Wattana, and F. I. Manyakhin, Fiz. Tekh. Poluprovodn. (St. Petersburg) 37, 1131 (2003) [Semiconductors 37, 1107 (2003)].
S. V. Bulyarskiĭ and N. S. Grushko, Generation-Recombination Processes in Active Elements (Izd. MGU, Moscow, 1995) [in Russian].
A. A. Lebedev, Fiz. Tekh. Poluprovodn. (St. Petersburg) 31, 437 (1997) [Semiconductors 31, 371 (1997)].
S. V. Bulyarskiĭ and N. S. Grushko, Zh. Éksp. Teor. Fiz. 118, 1222 (2000) [JETP 91, 1059 (2000)].
Author information
Authors and Affiliations
Additional information
Original Russian Text © A.S. Ambrozevich, S.A. Ambrozevich, N.S. Grushko, L.N. Potanakhina, 2006, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2006, Vol. 32, No. 4, pp. 16–23.
Rights and permissions
About this article
Cite this article
Ambrozevich, A.S., Ambrozevich, S.A., Grushko, N.S. et al. Determining the energies of deep centers in heterostructures based on InGaN Solid solutions. Tech. Phys. Lett. 32, 146–148 (2006). https://doi.org/10.1134/S1063785006020180
Received:
Issue Date:
DOI: https://doi.org/10.1134/S1063785006020180