Abstract
Multilayer Ag/Y mirrors intended for the spectral range of 9–11 nm have been investigated. The parameters of mirrors, specifically, the thicknesses of transition layers, have been determined. The efficiency of B4C and Si barrier layers has been demonstrated. It has been shown that the properties of structures like Ag/Y and Ag/Y with B4C and Si barriers layers have poor temporal stability. The highest reflection coefficient of 18% at a wavelength of 9.34 nm, has been observed for the Ag/Si/Y structure. The same structure has the best temporal stability.
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REFERENCES
D. Martinez-Galarce, R. Soufli, D. L. Windt, M. Bruner, et al., Opt. Eng. 59, 095102 (2013).
N. I. Chkhalo, S. A. Garakhin, A. Ya. Lopatin, A. N. Nechay, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, N. N. Tsybin, and S. Yu. Zuev, AIP Adv. 8, 105003 (2018).
E. A. Vishnyakov, F. F. Kamenets, V. V. Kondratenko, M. S. Luginin, A. V. Panchenko, Yu. P. Pershin, A. S. Pirozhkov, and E. N. Ragozin, Quantum Electron. 42, 143 (2012).
Z. Wang, H. Wang, J. Zhu, et al., Appl. Phys. Lett. 89, 241120 (2006).
P. Gupta, T. P. Tenka, S. Rai, et al., J. Phys. D 40, 6684 (2007).
D. S. Kvashennikov, Yu. A. Vainer, S. Yu. Zuev, and V. N. Polkovnikov, J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech. 13, 177 (2019).
D. L. Windt and E. M. Gullikson, Appl. Opt. 54, 5850 (2015).
D. Xu, Q. Huang, Y. Wang, et al., Opt. Express 23, 33018 (2015).
C. Montcalm, P. A. Kearney, J. M. Slaughter, B. T. Sullivan, M. Chaker, H. Pepin, and C. M. Falco, Appl. Opt. 35, 5134 (1996).
I. G. Zabrodin, B. A. Zakalov, I. A. Kas’kov, E. B. Klyuenkov, V. N. Polkovnikov, N. N. Salashchenko, S. D. Starikov, and L. A. Suslov, J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech. 7, 637 (2013).
S. S. Andreev, A. D. Akhsakhalyan, M. A. Bibishkin, et al., Cent. Eur. J. Phys. 1, 191 (2003).
M. Svechnikov, D. Pariev, A. Nechay, et al., J. Appl. Crystallogr. 50, 1428 (2017).
S. Yu. Zuev, S. V. Kuzin, V. N. Polkovnikov, and N. N. Salashchenko, Bull. Russ. Acad. Sci.: Phys. 74, 50 (2010).
N. I. Chkhalo, D. E. Pariev, V. N. Polkovnikov, N. N. Salashchenko, R. A. Shaposhnikov, I. L. Stroulea, M. V. Svechnikov, Yu. A. Vainer, and S. Yu. Zuev, Thin Solid Films 631, 106 (2017).
M. V. Svechnikov, N. I. Chkhalo, S. A. Gusev, A. N. Nechay, D. E. Pariev, A. E. Pestov, V. N. Polkovnikov, D. A. Tatarskiy, N. N. Salashchenko, F. Schäfers, M. G. Sertsu, A. Sokolov, Yu. A. Vainer, and M. V. Zorina, Opt. Express 26, 33718 (2018).
Q. Zhong, Z. Zhang, R. Qi, J. Li, Z. Wang, K. L. Guen, J.-M. Andre, and P. Jonnard, Opt. Express 21, 14399 (2018).
Funding
This study was performed in accordance with State Task no. 0035-2014-0204 for the Institute of Physics of Microstructures. It was partially supported by the Russian Foundation for Basic Research (grant nos. 19-02-00081 and 17-52-150006) and a joint Russian–French CNRC/RFBR grant (PRC 2016, no. 1567).
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Translated by V. Isaakyan
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Kvashennikov, D.S., Zuev, S.Y., Polkovnikov, V.N. et al. Multilayer Ag/Y Mirrors for the Spectral Range of 9–11 nm. Tech. Phys. 64, 1684–1687 (2019). https://doi.org/10.1134/S1063784219110161
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DOI: https://doi.org/10.1134/S1063784219110161