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Ion-Optical System of an Ion Source with Energy Focusing in the Formed Beam

  • ELECTROPHYSICS, ELECTRON AND ION BEAMS, PHYSICS OF ACCELERATORS
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Abstract

Ways to reduce ion beam intensity losses in a mass spectrometric ion source, which are caused by chromatic aberration of its immersion ion-optical system, are considered. These losses are rather significant in forming a beam from ions with a large energy spread. The reduction of aberration losses is especially important when ion sources are used jointly with mass analyzers with energy focusing. It is shown that these losses can be reduced significantly by using a new type of ion-optical system of the ion source, which includes achromatic elements. A special method for calculating such elements is given. Computer simulations have shown high efficiency of such elements in the ion-optical path of ion sources of mass spectrometers.

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ACKNOWLEDGMENTS

This study was conducted under state task no. 007-00229-18-00.

The authors are grateful to K.V. Solov’ev and N.K. Krasnova (Department of Physical Electronics, Peter the Great St. Petersburg Polytechnic University) for useful advice.

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Authors and Affiliations

  1. Institute of Analytical Instrumentation, Russian Academy of Sciences, 190103, St. Petersburg, Russia

    I. A. Averin, A. S. Berdnikov, S. V. Masyukevich & L. N. Gall’

  2. Ioffe Institute, 194021, St. Petersburg, Russia

    N. S. Samsonova & N. R. Gall’

Authors
  1. I. A. Averin
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  2. A. S. Berdnikov
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  3. S. V. Masyukevich
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  4. N. S. Samsonova
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  5. N. R. Gall’
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  6. L. N. Gall’
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Corresponding author

Correspondence to I. A. Averin.

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Translated by V. A. Alekseev

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Averin, I.A., Berdnikov, A.S., Masyukevich, S.V. et al. Ion-Optical System of an Ion Source with Energy Focusing in the Formed Beam. Tech. Phys. 64, 564–568 (2019). https://doi.org/10.1134/S1063784219040042

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  • DOI: https://doi.org/10.1134/S1063784219040042

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