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X-Ray Computer Methods for Studying the Structural Integrity of Seeds and Their Importance in Modern Seed Science

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Abstract

X-ray computer methods of research (projection microfocus radiography and microtomography), which are used to study the problem of hidden defects of seeds and investigate its impact on sowing quality, have been considered. The description and main characteristics of technical means that were used to obtain digital two-dimensional and three-dimensional (tomographic) X-ray images of seeds have been given and the possible ways of their quantitative computer processing and analysis have been discussed. Conclusions about the abilities of the methods of projection microfocus radiography and microtomography to study the features of the internal structures of a seed that are related to the violation of its integrity have been formulated.

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ACKNOWLEDGMENTS

The authors express their gratitude to A.M. Kul’kov, who is an employee of The Center of X-ray Diffraction Studies at the Research park of St. Petersburg State University, for the computer analysis of the microtomographic image of wheat seeds.

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Authors and Affiliations

  1. Agrophysical Research Institute, 195220, St. Petersburg, Russia

    M. V. Arkhipov, N. S. Priyatkin & L. P. Gusakova

  2. St. Petersburg Electrotechnical University LETI, 197376, St. Petersburg, Russia

    N. N. Potrakhov, A. Yu. Gryaznov, V. B. Bessonov, A. V. Obodovskii & N. E. Staroverov

  3. Northwest Center of Interdisciplinary Studies of Food Supply and Problems, 196608, Pushkin, St. Petersburg, Russia

    M. V. Arkhipov

Authors
  1. M. V. Arkhipov
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  2. N. S. Priyatkin
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  3. L. P. Gusakova
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  4. N. N. Potrakhov
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  5. A. Yu. Gryaznov
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  6. V. B. Bessonov
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  7. A. V. Obodovskii
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  8. N. E. Staroverov
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Corresponding author

Correspondence to N. S. Priyatkin.

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Translated by N. Petrov

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Arkhipov, M.V., Priyatkin, N.S., Gusakova, L.P. et al. X-Ray Computer Methods for Studying the Structural Integrity of Seeds and Their Importance in Modern Seed Science. Tech. Phys. 64, 582–592 (2019). https://doi.org/10.1134/S1063784219040030

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  • DOI: https://doi.org/10.1134/S1063784219040030

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