Abstract
It has been found that the resistance of the (Bi0.3Sb0.7)2Te3 porous polycrystalline film fabricated by thermal vacuum evaporation at substrate temperature T s ≤ 363 K drastically decreases near the threshold AC frequency ω0 ≈ 105 Hz as low as the resistance of dense films with T s ≈ 423 K. After the action of N ≈ 105 cycles of mechanical deformation with amplitude ε = ±1 × 10–3 a.u., the film resistance increases by 1.5 times and the threshold frequency decreases in almost 102 times, which can qualitatively be accounted for by the model of microcontacting blocks.
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Original Russian Text © Kh.M. Sulaimonov, 2017, published in Zhurnal Tekhnicheskoi Fiziki, 2017, Vol. 87, No. 3, pp. 471–472.
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Sulaimonov, K.M. The effect of cycle deformation on the AC conductivity of (Bi0.3Sb0.7)2Te3 films. Tech. Phys. 62, 493–495 (2017). https://doi.org/10.1134/S1063784217030227
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DOI: https://doi.org/10.1134/S1063784217030227