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Selection and design of the secondary electron channel of the time-of-flight mass spectrometer

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Abstract

Computer simulation is carried out for selecting a compact electron-optical system of the channel for detecting secondary electrons formed during the interaction of xenon atoms or ions with energy of 1-30 keV with Xe atoms. The solid angle of passage of secondary electron beams in a wide range of their initial energies is calculated. The energy spectrum of secondary electrons with various energies is determined by constructing their deceleration curve.

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Authors and Affiliations

  1. Ioffe Physical Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021, Russia

    T. Ya. Fishkova, A. A. Basalaev & V. V. Kuz’michev

  2. Peter the Great St. Petersburg Polytechnic University, Politekhnicheskaya ul. 29, St. Petersburg, 194064, Russia

    V. V. Kuz’michev

Authors
  1. T. Ya. Fishkova
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  2. A. A. Basalaev
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  3. V. V. Kuz’michev
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Corresponding author

Correspondence to T. Ya. Fishkova.

Additional information

Original Russian Text © T.Ya. Fishkova, A.A. Basalaev, V.V. Kuz’michev, 2016, published in Zhurnal Tekhnicheskoi Fiziki, 2016, Vol. 86, No. 3, pp. 152–154.

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Fishkova, T.Y., Basalaev, A.A. & Kuz’michev, V.V. Selection and design of the secondary electron channel of the time-of-flight mass spectrometer. Tech. Phys. 61, 470–472 (2016). https://doi.org/10.1134/S1063784216030075

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  • DOI: https://doi.org/10.1134/S1063784216030075

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