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Investigation of the atomic, crystal, and domain structures of materials based on X-ray diffraction and absorption data: A review

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Abstract

Ways to gain and analyze experimental data obtained by X-ray techniques used in material examination are described. Emphasis is on the methods of extended X-ray absorption fine structure, X-ray diffraction, and X-ray low-angle scattering.

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Authors and Affiliations

  1. Ioffe Physical Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021, Russia

    M. E. Boiko, M. D. Sharkov, A. M. Boiko, S. G. Konnikov, A. V. Bobyl’ & N. S. Budkina

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  1. M. E. Boiko
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  2. M. D. Sharkov
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  3. A. M. Boiko
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  4. S. G. Konnikov
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  5. A. V. Bobyl’
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  6. N. S. Budkina
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Correspondence to M. E. Boiko.

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Original Russian Text © M.E. Boiko, M.D. Sharkov, A.M. Boiko, S.G. Konnikov, A.V. Bobyl’, N.S. Budkina, 2015, published in Zhurnal Tekhnicheskoi Fiziki, 2015, Vol. 60, No. 11, pp. 1–29.

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Boiko, M.E., Sharkov, M.D., Boiko, A.M. et al. Investigation of the atomic, crystal, and domain structures of materials based on X-ray diffraction and absorption data: A review. Tech. Phys. 60, 1575–1600 (2015). https://doi.org/10.1134/S1063784215110067

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