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Experimental and numerical investigation of two mechanisms underlying runaway electron beam formation

  • Electron and Ion Beams, Accelerators
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Abstract

The electrical breakdown of a gas-filled diode with a highly nonuniform electric field is studied in the case when a 25-kV voltage pulse generates runaway electron beams with time-separated maxima of different duration behind anode foil. Experimental data are analyzed and numerically simulated using the PIC/MC code OOPIC-Pro. It is shown that, in terms of the model used, both beams arise at the cathode but their formation mechanisms differ. The first runaway electron beam no longer than 500 ps is attributed to the ionization mechanism; the second one, which may last several nanoseconds, is due to emission.

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Authors and Affiliations

  1. Institute of High-Current Electronics, Siberian Branch, Russian Academy of Sciences, Akademicheskii pr. 2/3, Tomsk, 634055, Russia

    E. Kh. Baksht, S. Ya. Belomyttsev, A. G. Burachenko, V. V. Ryzhov, V. F. Tarasenko & V. A. Shklyaev

Authors
  1. E. Kh. Baksht
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  2. S. Ya. Belomyttsev
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  3. A. G. Burachenko
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  4. V. V. Ryzhov
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  5. V. F. Tarasenko
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  6. V. A. Shklyaev
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Corresponding author

Correspondence to V. A. Shklyaev.

Additional information

Original Russian Text © E.Kh. Baksht, S.Ya. Belomyttsev, A.G. Burachenko, V.V. Ryzhov, V.F. Tarasenko, V.A. Shklyaev, 2012, published in Zhurnal Tekhnicheskoi Fiziki, 2012, Vol. 82, No. 7, pp. 102–106.

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Baksht, E.K., Belomyttsev, S.Y., Burachenko, A.G. et al. Experimental and numerical investigation of two mechanisms underlying runaway electron beam formation. Tech. Phys. 57, 998–1002 (2012). https://doi.org/10.1134/S1063784212070031

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  • DOI: https://doi.org/10.1134/S1063784212070031

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