Abstract
The properties of low-refractive-index carbon films obtained by close-spaced vapor transport at graphite sublimation are studied. The optical properties of the films are investigated by monochromatic multiple-angle ellipsometry, and their morphology is examined by AFM. It is found that the films have a columnar structure with a background surface roughness of about 1 nm. In addition, the surface of the film contains islands up to 50 nm in height with a footprint of ≈200 nm. A low-refractive-index carbon film deposited by close-spaced vapor transport on silicon tips is found to decrease the field emission threshold and drastically raise the current.
Similar content being viewed by others
References
Y. Lifshitz, Diamond Relat. Mater. 5, 388 (1996).
D. Camino, A. H. S. Jones, D. Mercs, and D. G. Teer, Vacuum 52, 125 (1999).
V. G. Litovchenko, Fiz. Khim. Tverd. Tela 5, 9 (2004).
T. V. Semikina, Optoelektron. Poluprovod. Tekh. (Kiev), No. 41, 121 (2006).
A. I. Popov and V. A. Vorontsov, Fiz. Tekh. Poluprovodn. (St. Petersburg) 35, 665 (2001) [Semiconductors 35, 637 (2001)].
V. S. Khomchenko, N. V. Sopinskii, A. K. Savin, O. S. Litvin N. S. Zayats, V. B. Khachatryan, and A. A. Korchevoi, Zh. Tekh. Fiz. 78(6), 84 (2008) [Tech. Phys. 53, 757 (2008)].
M. P. Siegal, D. L. Overmyer, and P. P. Provencio, Appl. Phys. Lett. 80, 2171 (2002).
B. S. Satyanarayana, J. Robertson, and W. I. Milne, J. Appl. Phys. 87, 3126 (2000).
R. M. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977; Mir, Moscow, 1981).
N. V. Sopinskii, Mikroelektronika 30, 41 (2001) [Russian Microelectronics 30, 35 (2001)].
M. V. Sopinskyy, P. E. Shepelyavyi, A. V. Stronski, and E. F. Venger, J. Opt. Adv. Mater. 7, 2255 (2005).
N. A. Semenenko, Candidate’s Dissertation (Kiev, 2008).
L. A. Golovan’, P. K. Kashkarov, and V. Yu. Timoshenko, Kristallografiya 52, 697 (2007) [Crystallogr. Rep. 52, 672 (2007)].
V. Litovchenko, A. Evtukh, Yu. Kryuchenko, N. Goncharuk, O. Yilmazoglu, K. Mutamba, H. L. Hartnagel, and D. Pavlidis, J. Appl. Phys. 96, 866 (2004).
A. A. Evtukh, N. I. Klyui, V. G. Litovchenko, A. N. Luk’yanov, B. O. Movchan, and Yu. P. Piryatinskii, Optoelektron. Poluprovod. Tekh. (Kiev), No. 41, 100 (2006).
A. A. Evtukh, M. I. Klyui, L. A. Krushins’ka, Yu. A. Kurapov, V. G. Litovchenko, A. M. Luk’yanov, B. O. Movchan, and M. O. Semenenko, Ukr. Fiz. Zh. 53, 179 (2008).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © N.V. Sopinskii, V.S. Khomchenko, O.S. Litvin, A.K. Savin, N.A. Semenenko, A.A. Evtukh, V.P. Sobolevskii, G.P. Ol’khovik, 2011, published in Zhurnal Tekhnicheskoi Fiziki, 2011, Vol. 81, No. 11, pp. 125–129.
Rights and permissions
About this article
Cite this article
Sopinskii, N.V., Khomchenko, V.S., Litvin, O.S. et al. Properties of low-refractive-index films obtained by the close-spaced vapor transport technique under the sublimation of graphite in a quasi-closed volume. Tech. Phys. 56, 1665–1669 (2011). https://doi.org/10.1134/S1063784211110259
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063784211110259