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Aberration-free long lateral shear interferometry

  • Optics, Quantum Electronics
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Abstract

The possibility is considered of increasing the degree of compensation of residual aberrations in holographic long lateral shear interferometry by using several reference patterns recorded at different lateral shear lengths. This aberration compensation technique was used to visualize distributions of refractive index variations in glass samples of different sizes and shapes that appear as a result of a thermal action on them.

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Authors and Affiliations

  1. Janka Kupala State University, ul. Ozheshko 22, Grodno, 230023, Belarus

    A. I. But’ & A. M. Lyalikov

Authors
  1. A. I. But’
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  2. A. M. Lyalikov
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Correspondence to A. M. Lyalikov.

Additional information

Original Russian Text © A.I. But’, A.M. Lyalikov, 2010, published in Zhurnal Tekhnicheskoĭ Fiziki, 2010, Vol. 80, No. 9, pp. 97–103.

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But’, A.I., Lyalikov, A.M. Aberration-free long lateral shear interferometry. Tech. Phys. 55, 1330–1335 (2010). https://doi.org/10.1134/S1063784210090161

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  • DOI: https://doi.org/10.1134/S1063784210090161

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