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Evaluation of the Single-Photon Detector Characteristics Depending on the Parameters of a WxSi1 – x Superconducting Film

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Abstract

The absorption efficiency, cutoff wavelength, and recovery time of a superconducting single-photon detector depending on sheet resistance Rs and critical temperature Tс of the WxSi1 – x film were calculated. The calculated dependences of the detector characteristics for the WxSi1 – x films show that the films with Tc > 3.5 K and 300 < Rs < 420 Ω/sq will provide ηabs ≈ 15–20% and ηIDE = 100% at a radiation wavelength of 1550 nm and a detector recovery time of τ < 40 ns, which corresponds to the possible detector count rate CRmax = 25 MHz.

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Authors and Affiliations

  1. Bauman Moscow State Technical University, 105005, Moscow, Russia

    S. Yu. Hydyrova, I. A. Stepanov, D. D. Vasilev & K. M. Moiseev

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  1. S. Yu. Hydyrova
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  2. I. A. Stepanov
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  3. D. D. Vasilev
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  4. K. M. Moiseev
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Correspondence to S. Yu. Hydyrova.

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Translated by Z. Smirnova

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Hydyrova, S.Y., Stepanov, I.A., Vasilev, D.D. et al. Evaluation of the Single-Photon Detector Characteristics Depending on the Parameters of a WxSi1 – x Superconducting Film. Phys. Solid State 63, 1410–1413 (2021). https://doi.org/10.1134/S106378342109016X

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  • DOI: https://doi.org/10.1134/S106378342109016X

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