The Co/TiO2 multilayer thin films have been deposited by e-beam evaporation method on glass substrates in vacuum and annealed in air at 773 K for 1 h. The crystal structure, surface morphology, optical properties, electrical properties and magnetic properties of Co/TiO2 multilayer thin films have been systematically investigated. The results showed that the particle sizes were significantly reduced when the samples are annealed and the enlargement of particle size occurred when the samples thickness is increased. The spectroscopic analysis exhibited enhanced transmittance and higher optical band gap of annealed sample than the as-deposited one and it was decreased with sample thickness. The resistivity measurement confirmed resistivity decreament with temperature. Furthermore, by investigating the magnetic properties, room temperature ferromagnetism was observed.
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Y. Yamada, H. Toyosaki, A. Tsukazaki, and T. Fukumura, J. Appl. Phys. 96, 5097 (2004).
M. Baghaie Yazdi, M.-L. Goyallon, T. Bitsch, A. Kastner, M. Schlott, and L. Alff, Thin Solid Films 519, 2531 (2011).
J. Philip, A. Punnoose, B. I. Kim, K. M. Reddy, S. Layne, J. O. Holmes, B. Satpati, P. R. Leclair, T. S. Santos, and J. S. Moodera, Nat. Mater. 5, 298 (2006).
Y. Matsumoto, M. Murakami, T. Shono, T. Hasegawa, T. Fukumura, M. Kawasaki, P. Ahmet, T. Chikyow, and S. Koshihara, Science (Washington, DC, U. S.) 291, 854 (2001).
K. M. Krishnan, A. B. Pakhomov, Y. Bao, P. Blomqvist, Y. Chun, M. Gonzales, K. Griffin, X. Ji, and B. K. Roberts, J. Mater. Sci. 41, 793 (2006).
N. H. Hong, J. Sakai, N. Poirot, and V. Brize, Phys. Rev. B 73, 132404 (2006).
S. A. Wolf, D. D. Awschalom, R. A. Buhrman, J. M. Daughton, S. von Molnár, M. L. Roukes, A. Y. Chtchelkanova, D. M. Treger, Science, 294, 1488 (2001).
H. Ohno, Science (Washington, DC, U. S.) 281, 951 (1998).
J. K. Furdyna, J. Appl. Phys. 64, R29 (1988).
Phtocatalytic Purification and Treatment of Water and Air, Ed. by D. F. Ollis and H. Al-Ekabi (Elsevier, Amsterdam, 1993).
S. J. Pearton, S. J Heo, M. Ivill, D. P. Norton, and T. Steiner, Semicond. Sci. Technol. 19, R59 (2004).
M. S. Park, S. K. Kwon, and B. I. Min, Phys. Rev. B 65, 161201(R) (2002).
T. Fukumura, Y. Yamada, K. Tamura, and K. Nakajima, Jpn. J. Appl. Phys. 42, 105 (2003).
S. A. Chambers, T. Droubay, C. M. Wang, and A. S. Lea, Appl. Phys. Lett. 82, 1257 (2003).
C. Huang, X. Liu, Y. Liu, and Y. Wang, Chem. Phys. Lett. 432, 468 (2006).
S. Tolansky, Multiple Beam Interferometry of Surface and Films (Oxford Univ. Press, London, 1948).
C. Fan, P. Xue, and Y. Sun, J. Rare Earths 24, 309 (2006).
V. Stengle, S. Bakardjieva, and N. Murafa, J. Mater. Chem. Phys. 114, 217 (2008).
P. Kubelka and F. Munk, Z. Tech. Phys. (Leipzig) 12, 593 (1931).
P. Kubelka, J. Opt. Soc. Am. 38, 448 (1948).
W. E. Vargas and G. A. Niklasson, Appl. Opt. 36, 5580 (1997).
M. Asemi and M. Ghanaatshoar, Ceram. Int. 42, 6664 (2016).
F. Demichelis, G. Kaniadakis, A. Tagliferro, and E. Tresso, J. Appl. Opt. 26, 1737 (1987).
Young Ran Park and Kwang Joo Kim, Thin Solid Films 484, 34 (2005).
S. M. Sze, Semiconductor Devices: Physics and Technology (Wiley, New York, 2001).
J. Ederth, P. Johnsson, G. A. Niklasson, A. Hoel, A. Hultaker, P. Heszler, C. G. Granqvist, A. R. van Doorn, M. J. Jongerius, and D. Burgard, Phys. Rev. B 68, 155410 (2003).
M. Jannesari, M. Asemi, and M. Ghanaatshoar, J. Sol-Gel. Sci. Technol. 83, 181 (2017).
The authors would like to acknowledge the support of the Department of Applied Physics and Electronic Engineering, Rajshahi University, Central Science Laboratory, Rajshahi University and Atomic Energy Centre, Dhaka for essential samples preparation and characterization. The authors also greatefully appreciate the financial support from the Ministry of Science and Technology of Bangladesh.
The authors declare that there in no conflict of interest.
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Hossain, M.F., Nahid, M.A., Pervez, M.S. et al. Semiconductor Behavior and Room Temperature Ferromagnetism in e-Beam Evaporated Co/TiO2 Multilayer Thin Films. Phys. Solid State 61, 1363–1369 (2019). https://doi.org/10.1134/S1063783419080298
- Co/TiO2 multilayer
- e-beam evaporation method
- grain size
- band gap
- room temperature ferromagnetism