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Complementary application of neutron and synchrotron X-ray scattering to the determination of the magnetic microstructure of exchange-coupled layered nanoheterostructures

  • Proceedings of the XIV International Symposium “Nanophysics and Nanoelectronics-2010” (Nizhni Novgorod, Russia, March 15–19, 2010) Magnetism and Ferroelectricity
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Abstract

Complementary neutron and synchrotron X-ray scattering techniques have been considered as applied to the investigation of an inhomogeneous magnetic microstructure typical of exchange-coupled nanoheterostructures consisting of alternating ferromagnetic and antiferromagnetic metal layers. It has been demonstrated that changes in magnetic moments in both the magnitude and the direction within ferromagnetic layers can be determined by combining polarized neutron and resonant X-ray magnetic reflectometry, and those within antiferromagnetic layers, by combining X-ray and neutron diffractometry.

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Authors and Affiliations

  1. Institute of Metal Physics, Ural Branch, Russian Academy of Sciences, ul. Sof’i Kovalevskoĭ 18, Yekaterinburg, 620219, Russia

    E. A. Kravtsov & V. V. Ustinov

  2. Yeltsin Ural Federal University (Ural State Technical University—UPI), ul. Mira 19, Yekaterinburg, 620002, Russia

    E. A. Kravtsov

Authors
  1. E. A. Kravtsov
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  2. V. V. Ustinov
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Correspondence to E. A. Kravtsov.

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Original Russian Text © E.A. Kravtsov, V.V. Ustinov, 2010, published in Fizika Tverdogo Tela, 2010, Vol. 52, No. 11, pp. 2116–2119.

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Kravtsov, E.A., Ustinov, V.V. Complementary application of neutron and synchrotron X-ray scattering to the determination of the magnetic microstructure of exchange-coupled layered nanoheterostructures. Phys. Solid State 52, 2259–2262 (2010). https://doi.org/10.1134/S1063783410110077

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  • DOI: https://doi.org/10.1134/S1063783410110077

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