Abstract
A method has been developed for revealing intercrystalline boundaries and mutual orientation of crystallites in bismuth films with the use of natural oxidation in combination with atomic-force microscopy. For bismuth films prepared through vacuum thermal evaporation on mica substrates, the block boundaries have been revealed, the sizes of blocks have been determined, and their mutual crystallographic orientation has been established. The results obtained have been used to determine thermal evaporation conditions that ensure a higher perfection of the film structure.
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V. M. Grabov, E. V. Demidov, and V. A. Komarov, Fiz. Tverd. Tela (St. Petersburg) 50(7), 1312 (2008) [Phys. Solid State 50 (7), 1365 (2008)].
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Original Russian Text © V.M. Grabov, E.V. Demidov, V.A. Komarov, M.M. Klimantov, 2009, published in Fizika Tverdogo Tela, 2009, Vol. 51, No. 4, pp. 800–802.
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Grabov, V.M., Demidov, E.V., Komarov, V.A. et al. Atomic-force microscopy of bismuth film defects decorated by oxidation. Phys. Solid State 51, 846–848 (2009). https://doi.org/10.1134/S1063783409040362
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DOI: https://doi.org/10.1134/S1063783409040362