Abstract
Time-resolved interferometry with a 100-fs temporal resolution was applied for the first time to studying the relaxation of electronic excitations in complex oxides, namely, tungstates CDWO4 with a crystal lattice of the wolframite-type and CaWO4 with a scheelite-type lattice. Two stages of charge carrier relaxation, namely, very fast carrier trapping in 200 fs resulting in self-trapped exciton formation and a relatively slow picosecond relaxation process probably due to configurational relaxation within the oxyanion molecule and modification of the surrounding lattice, are revealed in tungstate crystals. Corresponding models of self-trapped exciton creation in tungstate crystals are discussed.
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Nagirnyi, V., Geoffroy, G., Guizard, S. et al. Relaxation of electronic excitations in wide-gap crystals studied by femtosecond interferometry technique. Phys. Solid State 50, 1784–1788 (2008). https://doi.org/10.1134/S1063783408090382
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DOI: https://doi.org/10.1134/S1063783408090382