Abstract
The relation of the electrical properties of semiconducting samarium sulfide (SmS) to the size of coherent scattering regions for x-rays is considered. The dependence of the carrier concentration on the size of coherent scattering regions in single-crystal and polycrystalline SmS samples, as well as in thin samarium sulfide films, is established experimentally. A satisfactory agreement of the calculated curves with the experiment suggests that the size of coherent scattering regions has a dominant effect on the concentrations of charge carriers and defect samarium ions in SmS. The effect of thermal shocks on the size of coherent scattering regions in SmS single crystals and polycrystals, as well as in polycrystalline Sm0.4Eu0.6S samples, is investigated.
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Original Russian Text © N.V. Sharenkova, V.V. Kaminskiĭ, M.V. Romanova, L.N. Vasil’ev, G.A. Kamenskaya, 2008, published in Fizika Tverdogo Tela, 2008, Vol. 50, No. 7, pp. 1158–1161.
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Sharenkova, N.V., Kaminskiĭ, V.V., Romanova, M.V. et al. Effect of the size of x-ray coherent-scattering regions on the electrical parameters of semiconducting SmS. Phys. Solid State 50, 1207–1210 (2008). https://doi.org/10.1134/S1063783408070020
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DOI: https://doi.org/10.1134/S1063783408070020