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Jumplike deformation of polymer materials on the micrometer and submicrometer structural levels

  • Defects and Impurity Centers, Dislocations, and Physics of Strength
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Abstract

Jumplike creep is considered as a reflection of the structural heterogeneity of amorphous polymers on the mesoscopic and nanoscopic levels. The D-450 epoxy resin, poly(vinyl chloride), poly(vinyl butyral), and a composite consisting of the D-450 epoxy resin and diabase microparticles are studied at a temperature of 290 K. The creep rate of the specimens under compression is measured with a laser interferometer in submicrometer-scale deformation increments. Periodic variations of the creep rate with time or under deformation correspond to a jumplike (stepwise) behavior of the creep. It is shown that diabase particles (5–10 μm in size) are responsible for the appearance of micrometer-scale jumps in the creep of the composite and that the deformation jumps on the nanometer level are comparable to the sizes of the globules. The role of the resolution of the method employed in the evaluation of the scale of deformation jumps and structural units is considered.

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Original Russian Text © N.N. Peschanskaya, J. Hristova, 2006, published in Fizika Tverdogo Tela, 2006, Vol. 48, No. 10, pp. 1786–1790.

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Peschanskaya, N.N., Hristova, J. Jumplike deformation of polymer materials on the micrometer and submicrometer structural levels. Phys. Solid State 48, 1896–1901 (2006). https://doi.org/10.1134/S1063783406100131

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  • DOI: https://doi.org/10.1134/S1063783406100131

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