Abstract
Radiation-induced E′ centers in SiO2 were studied to test the possibility of applying optically stimulated electron emission (OSEE) to the spectroscopy of excited states of point defects in dielectrics. The spectral responses of the OSEE of crystalline α quartz and silica glass irradiated by 10-MeV electrons were measured and studied. It was established that volume E′ centers in the crystalline and glassy SiO2 modifications are dominant emission-active defects. Surface E’s (1) centers were also detected in glassy SiO2. A model of the energy structure of E′ centers accounting for the absence of luminescence and taking into account the presence of two nonradiative (intracenter and ionization) relaxation channels is proposed. This model was used to explain the mechanism of photothermal decay of the E′ centers and to determine the ionization activation barriers and quantum yields of these centers. The emission, spectral, and kinetic parameters of the volume and surface E′ centers in glassy SiO2 were obtained, showing the excited states of these defects to have identical atomic configurations.
Similar content being viewed by others
References
Defects in SiO 2 and Related Dielectrics: Science and Technology, Ed. by G. Paccioni, L. Skuja, and D. L. Griscom (Kluwer, Dordrecht, 2000).
Structure and Imperfections in Amorphous and Crystalline Silicon Dioxide, Ed. by R. A. B. Devine, J. P. Duraud, and E. Dooryhe, (Wiley, New York, 2000).
L. N. Skuja, J. Non-Cryst. Solids 239, 16 (1998).
S. M. Brekhovskikh and V. L. Tyul’nin, Radiation-Induced Centers in Inorganic Glasses (Energoatomizdat, Moscow, 1988) [in Russian].
D. Yu. Biryukov, A. F. Zatsepin, and V. S. Kortov, Fiz. Khim. Stekla 27(4), 503 (2001) [Glass Phys. Chem. 27 (4), 337 (2001)].
R. A. Weeks, J. Appl. Phys. 27, 1376 (1956).
F. J. Feigl and W. B. Fowler, Solid State Commun. 14(3), 225 (1974).
J. K. Rudra and W. B. Fowler, Phys. Rev. B: Condens. Matter 35(15), 8223 (1987).
K. C. Snyder and W. B. Fowler, Phys. Rev. B: Condens. Matter 48, 13 238 (1993).
D. L. Griscom, Phys. Rev. B: Condens. Matter 22, 4192 (1980).
A. A. Bobyshev and V. A. Radtsig, Fiz. Khim. Stekla 14(4), 501 (1988).
V. A. Radtsig, Khim. Fiz. 14(8), 125 (1995).
E. H. Poindexter and W. L. Warren, J. Electrochem. Soc. 142, 2508 (1995).
V. S. Kortov, V. A. Gubanov, A. F. Zatsepin, G. B. Cherlov, and S. P. Freidman, Izv. Akad. Nauk SSSR, Ser. Fiz. 49(9), 1841 (1985).
A. F. Zatsepin, V. G. Mazurenko, V. S. Kortov, and V. A. Kalent’ev, Fiz. Tverd. Tela (Leningrad) 30(11), 3472 (1988) [Sov. Phys. Solid State 30 (11), 1993 (1988)].
A. F. Zatsepin, V. I. Ushkova, and V. A. kalent’ev, Poverkhnost, No. 6, 100 (1990).
Y. Kawaguchi and S. Yamamoto, Radiat. Prot. Dosim. 65(1–4), 409 (1996).
V. A. Zakrevskii, Fiz. Khim. Stekla 14(2), 256 (1988).
G. Pacchioni, G. Ierano, and A. M. Marques, Phys. Rev. Lett. 81(2), 377 (1998).
A. F. Zatsepin, D. Yu. Biryukov, and V. S. Kortov, Latv. J. Phys. Tech. Sci., No. 6, 83 (2000).
V. S. Kortov, A. F. Zatsepin, and D. Yu. Biryukov, Photostimulated Exoelectron Emission Spectroscopy of Optically Active Defects on the Surface of Materials: Methodological Aspects (Ural State Technical University-Ural Polytechnical Institute, Yekaterinburg, 2001) [in Russian].
Kh. F. Kyaémbre, A. I. Belkind, V. V. Bichevin, and A. A. Kask, Radiotekh. Élektron. (Moscow) 14(12), 2216 (1969).
A. F. Zatsepin, V. S. Kortov, and Yu. V. Shchapova, Radiotekh. Élektron. (Moscow) 37(2), 326 (1992).
I. A. Weinstein, A. F. Zatsepin, and V. S. Kortov, Latv. J. Phys. Tech. Sci., No. 6, 68 (2000).
V. A. Gubanov, A. F. Zatsepin, V. S. Kortov, S. P. Freidman, and G. B. Cherlov, Zh. Prikl. Spektrosk. 49(1), 97 (1988).
Author information
Authors and Affiliations
Additional information
Original Russian Text © A.F. Zatsepin, D.Yu. Biryukov, V.S. Kortov, 2006, published in Fizika Tverdogo Tela, 2006, Vol. 48, No. 2, pp. 229–238.
Rights and permissions
About this article
Cite this article
Zatsepin, A.F., Biryukov, D.Y. & Kortov, V.S. Photoelectron spectroscopy of E′ centers in crystalline and glassy silicon dioxide. Phys. Solid State 48, 245–254 (2006). https://doi.org/10.1134/S1063783406020090
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1134/S1063783406020090