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Effect of the interface structure in multilayered systems on x-ray specular scattering spectra

  • Low-Dimensional Systems and Surface Physics
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Abstract

The effect of the spatial structure of an interface in multilayer metallic films on the spectrum of x-ray specular scattering is studied. Two types of interface structural defects are considered. One type is steps resulting in a variable layer thickness, and the other is the mixing of unlike metal atoms during epitaxial growth. These defects are shown to have different effects on the specular-scattering spectra. The mixing significantly decreases the Bragg-peak height, especially the height of higher order peaks. The interface roughness results in broadening of the Bragg peaks and in the disappearance of intermediate peaks between them.

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Authors and Affiliations

  1. Fock Institute of Physics, St. Petersburg State University, Ul’yanovskaya ul. 1 Petrodvorets, St. Petersburg, 198904, Russia

    V. P. Romanov, S. V. Uzdin & S. V. Ul’yanov

  2. St. Petersburg State University, Universitetskaya nab. 7/9, St. Petersburg, 199178, Russia

    V. M. Uzdin

  3. St. Petersburg Institute of Trade and Economics, ul. Novorossiĭskaya 50, St. Petersburg, 194021, Russia

    S. V. Ul’yanov

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  1. V. P. Romanov
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  2. S. V. Uzdin
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  3. V. M. Uzdin
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  4. S. V. Ul’yanov
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Romanov, V.P., Uzdin, S.V., Uzdin, V.M. et al. Effect of the interface structure in multilayered systems on x-ray specular scattering spectra. Phys. Solid State 48, 155–163 (2006). https://doi.org/10.1134/S106378340601029X

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  • DOI: https://doi.org/10.1134/S106378340601029X

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