Molebdenum (Mo) thin films were deposited on well-cleaned soda-lime glass substrates using DC-plasma magnetron sputtering. In the design of experiment deposition was optimized for maximum beneficial characteristics by monitoring effect of process variables such as deposition power (100–200 W). Their electrical, structural and morphological properties were analyzed to study the effect of these variables. The electrical resistivity of Mo thin films could be reduced by increasing deposition power. Within the range of analyzed deposition power, Mo thin films showed a mono crystalline nature and the crystallites were found to have an orientation along  direction. The surface morphology of thin films showed that a highly dense micro structure has been obtained. The surface roughness of films increased with deposition power. The adhesion of Mo thin films could be improved by increasing the deposition power. Atomic force microscopy was used for the topographical study of the films and to determine the roughness of the films. X-ray diffractrometer and scanning electron microscopy analysis were used to investigate the crystallinity and surface morphology of the films. Hall effect measurement system was used to find resistivity, carrier mobility and carrier density of deposited films. The adhesion test was performed using scotch hatch tape adhesion test. Mo thin films prepared at deposition power of 200 W, substrate temperature of 23°C and Ar pressure of 0.0123 mbar exhibited a mono crystalline structure with an orientation along (110) direction, thickness of ∼550 nm and electrical resistivity value of 0.57 × 10−4 Ω cm.
This is a preview of subscription content, access via your institution.
Buy single article
Instant access to the full article PDF.
Tax calculation will be finalised during checkout.
J. H. Scofield, A. Duda, D. Albin, B. L. Ballard, and P. K. Predecki, Thin Solid Films 260, 26 (1995).
J. S. Lin, R. C. Budhani, and R. F. Bunshah, Thin Solid Films 153, 359 (1987).
G. Gordillo, F. Mesa, and C. Caldero’n, Braz. J. Phys. 36(3B), 982 (2006).
T. T. Bardin, J. G. Pronko, R. C. Budhani, J. S. Lin, and R. F. Bunshah, Thin Solid Films 165, 243 (1988).
K. Orgass, H. W. Schock, and J. H. Werner, Thin Solid Films 387, 431 (2003).
M. A. Martinez and C. J. Guille’n, Surf. Coat. Technol. 110, 62 (1998).
S. Y. Kuo, L. B. Chang, M. J. Leng, W. T. Lin, Y. T. Lu, and S. C. Hu, Mater. Res. Soc. Symp. Proc. 1123 (2009).
S. G. Malhotra, Z. U. Rek, S. M. Yalisove, and J. C. Bilello, J. Vac. Sci. Technol. A 15, 345 (1997).
T. J. Vink, M. A. J. Somers, J. L. C. Daams, and A. G. Driks, J. Appl. Phys. 70, 4301 (1991).
K. H. Yoon, S. K. Kim, R. B. V. Chalapathy, J. H. Yun, J. C. Lee, and J. Song, J. Korean Phys. Soc. 45, 1114 (2004).
The article is published in the original.
About this article
Cite this article
Khan, M., Islam, M. Deposition and characterization of molybdenum thin films using dc-plasma magnetron sputtering. Semiconductors 47, 1610–1615 (2013). https://doi.org/10.1134/S1063782613140017
- Root Mean Square
- Soda Lime Glass
- Thin Film Solar Cell
- Dense Microstructure
- Deposition Power