Identification of Multiply Charged Ions by Means of Detectors Based on Phosphate Glass

Abstract

The detection and identification of heavy ions in phosphate glasses is based on an analysis of geometric parameters of tracks that manifest themselves upon the etching of irradiated glasses in a special solution. The shape and size of emerging tracks depend both on the parameters of the ions being studied (charge, energy, and angle of incidence) and on the etching conditions (etchant composition and concentration and etching time). Phosphate glass belongs to the class of solid-state tracking detectors whose principle of operation relies on the fact that multiply charged particles destroy a local solid-state structure along their trajectory. This local damage can be intensified by means of subsequent etching, whereby the tracks under study are visualized. The damaged parts of the material react with an etchant more intensely than intact parts do. This reaction leads to the formation of characteristic etching cones.The radiation damage of the material is proportional, as well as the specific energy loss of charged particles is, to the square of the particle charge and also depends on the particle speed.