Abstract
The effect of irradiation with soft X-rays produced by a laser plasma source equipped with an X-ray concentrator on the properties of the CdHgTe semiconductor are investigated. For this purpose, the mass concentration of atoms in the near-surface layer of the material is measured. It is demonstrated that the action of soft X-ray radiation leads to change in the solid-solution composition at the surface via a nonthermal mechanism and generates surface defects.
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V. G. Sredin, O. B. Ananyin, I. D. Burlakov, A. E. Mirofyanchenko, A. P. Melekhov, and I. K. Novikov, Prikl. Fiz., No. 6, 17 (2013).
V. G. Sredin, O. B. Ananyin, I. D. Burlakov, G. S. Bogdanov, E. A. Ivanitskaya, D. V. Lavrukhin, and A. P. Melekhov, Izv. Vyssh. Uchebn. Zaved., Fiz. 56 (9/2), 113 (2013).
A. V. Voitsekhovsky, S. N. Nesmelov, S. M. Dzyadukh, V. G. Sredin, O. B. Ananyin, A. P. Melekhov, and G. Yu. Sidorov, Izv. Vyssh. Uchebn. Zaved., Fiz. 59 (9/2), 198 (2016).
V. G. Sredin, A. V. Voitsekhovsky, O. B. Ananyin, A. P. Melekhov, S. N. Nesmelov, and S. M. Dzyaduh, Prikl. Fiz., No. 4, 54 (2018).
O. B. Ananyin, G. S. Bogdanov, I. A. Gerasimov, A. P. Melekhov, I. K. Novikov, and R. Sh. Ramakoti, Izv. Vyssh. Uchebn. Zaved., Fiz. 56 (9/2), 40 (2013).
Jeping Xu, Extended Abstract of Cand. Sci. (Phys. Math.) Dissertation (Mosc. Eng. Phys. Inst., Moscow, 2002).
V. Yu. Znamensky, Extended Abstract of Cand. Sci. (Phys. Math.) Dissertation (Mosc. Eng. Phys. Inst., Moscow, 1994).
A. Sher, A. Chen, W. E. Spicer, and C.-K. Shin, J. Vac. Sci. Technol. A 3, 105 (1985).
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Russian Text © The Author(s), 2019, published in Yadernaya Fizika i Inzhiniring, 2019, Vol. 10, No. 2.
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Ramakoti, R.S., Anan’in, O.B., Melekhov, A.P. et al. Nonthermal Mechanism of Defect Formation in the CdHgTe Semiconductor on Exposure to Soft X-rays. Phys. Atom. Nuclei 82, 1571–1575 (2019). https://doi.org/10.1134/S1063778819110188
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DOI: https://doi.org/10.1134/S1063778819110188