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Time-of-flight measurements of heavy ions using Si PIN diodes

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Abstract

A new off-line timing method for PIN diode signals is presented which allows the plasma delay effect to be suppressed. Velocities of heavy ions measured by the new method are in good agreement within a wide range of masses and energies with velocities measured by time stamp detectors based on microchannel plates.

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Correspondence to A. O. Strekalovsky.

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Original Russian Text © A.O. Strekalovsky, D.V. Kamanin, Yu.V. Pyatkov, N.A. Kondratyev, V.E. Zhuchko, S. Ilić, A.A. Alexandrov, I.A. Alexandrova, N. Jacobs, E.A. Kuznetsova, G.V. Mishinsky, O.V. Strekalovsky, 2015, published in Yadernaya Fizika i Inzhiniring, 2015, Vol. 6, Nos. 5–6, pp. 290–296.

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Strekalovsky, A.O., Kamanin, D.V., Pyatkov, Y.V. et al. Time-of-flight measurements of heavy ions using Si PIN diodes. Phys. Atom. Nuclei 79, 1386–1390 (2016). https://doi.org/10.1134/S1063778816090131

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  • DOI: https://doi.org/10.1134/S1063778816090131

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