Abstract
The specular reflection of X rays from multilayer crystal structures on the surface of a single crystal under conditions of grazing noncoplanar diffraction is considered. Recurrent relations of a new type are obtained. A high sensitivity of the angular dependence of the specular reflection intensity in the diffraction region to the thickness and number of layers, their deformation, and degree of amorphization is shown.
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Translated by Yu. Sin’kov
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Bushuev, V.A., Oreshko, A.P. Recurrent Relations in Grazing Noncoplanar X-ray Diffraction in Multilayer Surface Crystal Structures. Crystallogr. Rep. 68, 396–401 (2023). https://doi.org/10.1134/S1063774523700086
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DOI: https://doi.org/10.1134/S1063774523700086