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Shifts of the Kiessig Oscillations and Faraday Rotation for X-ray Reflectivity from a Magnetized Film

  • DIFFRACTION AND SCATTERING OF IONIZING RADIATIONS
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Abstract

Appearance of the refraction effects and Faraday rotation of the plane of polarization of linearly polarized X rays has been analyzed for transmission and reflection at grazing incidence angles for a resonant film including the X-ray magnetic or Mössbauer scattering. It is shown that, when the magnetization is oriented along the radiation beam direction, magnetic additives to the susceptibility do not affect the phase shifts between the waves reflected from the surface and the substrate; however, they induce “orthogonal polarization” in the reflected beam, which corresponds to rotation of the plane of polarization. Rotation of the plane of polarization is maximum for the critical angle of total external reflection; it is characterized by an oscillating dependence on the grazing angle, which can be used in future to vary the polarization state of X-ray beams.

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Funding

This study was supported in part by the Ministry of Science and Higher Education of the Russian Federation (grant no. 075-15-2021-1353).

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Authors and Affiliations

  1. Moscow State University, 119991, Moscow, Russia

    M. A. Andreeva & R. A. Baulin

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  1. M. A. Andreeva
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  2. R. A. Baulin
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Correspondence to M. A. Andreeva.

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Translated by A. Sin’kov

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Andreeva, M.A., Baulin, R.A. Shifts of the Kiessig Oscillations and Faraday Rotation for X-ray Reflectivity from a Magnetized Film. Crystallogr. Rep. 68, 380–387 (2023). https://doi.org/10.1134/S1063774523700062

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